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In Situ Transport Measurements Reveal Source of Mobility Enhancement of MoS2 and MoTe2 during Dielectric Deposition

Shang, Ju Ying; Moody, Michael J.; Chen, Jiazhen; Krylyuk, Sergiy; Davydov, Albert V.; Marks, Tobin J.; Lauhon, Lincoln J.
Organizations: Lauhon Group
DOI: 10.18126/ypnx-y3of
Year: 2020

Chemical vapor deposition of monolayer MoS2 directly on ultrathin Al2O3 for low-power electronics

Bergeron, Hadallia; Sangwan, Vinod K.; McMorrow, Julian J.; Campbell, Gavin P.; Balla, Itamar; Liu, Xiaolong; Bedzyk, Michael J.; Marks, Tobin J.; Hersam, Mark C.
DOI: 10.18126/M2K041
Year: 2017