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In Situ Transport Measurements Reveal Source of Mobility Enhancement of MoS2 and MoTe2 during Dielectric Deposition
Shang, Ju Ying;
Moody, Michael J.;
Chen, Jiazhen;
Krylyuk, Sergiy;
Davydov, Albert V.;
Marks, Tobin J.;
Lauhon, Lincoln J.
Chemical vapor deposition of monolayer MoS2 directly on ultrathin Al2O3 for low-power electronics
Bergeron, Hadallia;
Sangwan, Vinod K.;
McMorrow, Julian J.;
Campbell, Gavin P.;
Balla, Itamar;
Liu, Xiaolong;
Bedzyk, Michael J.;
Marks, Tobin J.;
Hersam, Mark C.